THE MAIN ISSUES OF THE DIAGNOSTIC METHODOLOGY COMPLEX TECHNICAL OBJECTS 

Alexander M. Pankin, Doctor of technical sciences, associate professor, associate professor of Higher School of Nuclear and Thermal Power Engineering, Peter the Great Saint Petersburg Polytechnic University (29 Polytechnicheskaya street, St. Petersburg, Russia), E-mail: alpank@niti.ru 

681.518.3 

10.21685/2307-4205-2021-2-6 

Background. The article discusses the main stages in the development of algorithms for monitoring the technical state of complex objects, for which it is planned to create a new generation of diagnostic systems. Materials and methods. Previously created diagnostic systems were mainly focused on solving the problems of nondestructive testing, which do not allow sufficient assessment of the residual life of the controlled objects. Results and conclusions. The article also presents one of the algorithms for solving the problem of finding a defect when analyzing a possible malfunction of an object represented by an electrical circuit. The method is based on enumeration of possible topological graphs of a chain when constructing mathematical models of an object with different types of defects. 

technical object, control, diagnostics, technical condition, diagnostic feature, mathematical model, diagnostic model, defect, electrical circuit